Chun-ting "Tim" Wang Lee, Ph.D.
Signal Integrity Application Scientist, Keysight
Chun-ting "Tim" Wang Lee, Ph.D., is a Signal Integrity Application Scientist at Keysight, where he uses simulation tools and measurement insights to help engineers achieve better Signal Integrity (SI) in their designs. In his current role, he has been studying the Chiplet UCIe standard and has delivered presentations on the system-level SI challenges associated with chiplet designs. Recognized as one of DesignCon’s 40-under-40, Tim is known for his technical knowledge and clear and engaging communication style at industry conferences. He holds a Ph.D. in Signal Integrity from the University of Colorado at Boulder, focusing on achieving better simulation and measurement correlation for printed circuit board SI analysis. Tim's mission is to empower engineers with the knowledge and tools to confidently tackle signal integrity and chiplet design challenges.