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About

Sponsored by: Altair, Keysight Technologies, Rohde & Schwarz USA and COMSOL


Panel Participants: Eric Bogatin (University of Colorado Boulder - moderator), Marek Jableka (Altair), Heidi Barnes (Keysight Technologies) and Mike Schnecker (Rohde & Schwarz USA)


Abstract:

Passing an EMC certification test is often challenging. Key ingredients include following best design practices, leveraging technology options that reduce EMI problems and getting an early heads up on potential EMI problems before you make a trip to the anechoic chamber. We are assembling a panel of experts with solutions to tackle these daunting EMI design and test challenges.


Moderator: Eric Bogatin, Professor, University of Colorado Boulder

Panelist: Marek Jableka, Senior Technical Specialist, Electronic System Design, Altair

Panelist: Heidi Barnes, Senior Application Engineer, PathWave EDA for High Speed Digital, Keysight Technologies, Inc.

Panelist: Mike Schnecker, Business Development Manager, Rohde & Schwarz USA



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Presenters
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Eric Bogatin
Professor, University of Colorado Boulder
Eric Bogatin is currently a Professor in the ECEE dept at University of Colorado, Boulder, where he teaches courses on PCB design, signal integrity and systems engineering. He is also the technical editor of the Signal Integrity Journal and a Fellow at Teledyne LeCroy. Bogatin received his BS in physics from MIT and MS and PhD in physics from the University of Arizona in Tucson. He has held senior engineering and management positions at Bell Labs, Raychem, Sun Microsystems, Ansoft and Interconnect Devices. He has written 15 technical books in the field and presented classes and lectures on signal integrity worldwide.
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Marek Jableka
Senior Technical Specialist, Electronic System Design, Altair
Marek Jableka, MBA, MSc in Electronics, is currently the Senior Technical Specialist at Altair and focuses on helping customers in performing virtual validation for their products using Altair simulation tools. Marek has strong expertise in electrical simulation and provides training and support to solve problems in EMC, signal and power integrity, as well as electronic components modelling and PCB automated verification.
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Heidi Barnes
Senior Application Engineer, PathWave EDA for High Speed Digital, Keysight Technologies, Inc.
Heidi Barnes is a Senior Application Engineer and Power Integrity Product Owner for High-Speed Digital applications in the PathWave Software Solutions Group of Keysight Technologies. Her recent activities include the application of electromagnetic, transient, and channel simulators to solve signal and power integrity challenges. Author of over 30 papers on SI and PI, technical contributor for the new IEEE-370 Standard involving interconnect S-parameter quality after fixture removal, and recipient of the DesignCon 2017 Engineer of the Year. She was recently elected Co-Chair for the IEEE EPS EDMS Packaging Benchmark Sub-Committee.

Prior experience includes seven years in signal integrity for ATE test fixtures for Verigy, eight years in RF/Microwave microcircuit packaging for Agilent Technologies, ten years with NASA in the aerospace industry, and one year with Arco Solar in the solar cell industry. She has been with Keysight EDA software since 2012. She holds five patents and was awarded the NASA Silver Snoopy for her work hydrogen fire and gas detection work.

Heidi graduated from the California Institute of Technology in 1986 with a bachelor’s degree in electrical engineering.
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Mike Schnecker
Business Development Manager, Rohde & Schwarz USA
Michael Schnecker’s experience in the test and measurement industry includes applications, sales and product development and specialization in signal integrity applications using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mike held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers. Mike has more than two decades of experience working with oscilloscope measurements. His background in time and frequency domains provides him with unique insight into the challenges engineers face when testing high-speed systems for both power and signal integrity. Interacting with engineers in the industry daily has allowed Mike to master the ability to explain complex measurement science to engineers at any level. He also holds several patents, including methods and apparatus for analyzing serial data streams as well as coherent interleaved sampling. Thus, Mike is recognized as a thought leader and exceptional mentor in the signal and power integrity community. Mike has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering.
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