Pat Hindle is media director for Microwave Journal® and has been with the magazine for 12 years. He parlayed his process engineering background into a management role in marketing communications for several leading microwave semiconductor manufacturers including MACOM, Raytheon and Skyworks (Alpha Industries), in addition to working at MIT Nanostructures Laboratory manufacturing X-ray diffraction gratings for space research telescopes like Chandra. He has a B.S. in Materials Science Engineering from Cornell University and MBA from Northeastern University. In his current role as MWJ editorial director, he is responsible for setting MWJ’s editorial direction and developing marketing opportunities for industry clients. He has been the conference manager for EDI CON China and helped launch Signal Integrity™ Journal plus co-hosts the Frequency Matters videos and podcasts.