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About
Scanning Electron Microscope (SEM) is used to examine surface morphology in biological and material applications that demand the preservation of a specimen's surface details. Chemical processing is important to stabilize the structures, followed by critical point drying for drying samples for SEM applications.
To allow for sample imaging, non-conductive samples must be coated after drying. Adding a conductive coating of metal or carbon to the sample prevents charging, lowers heat damage, and improves the secondary electron signal needed for topography study. In addition to surface analysis, a comprehensive study of the sample using array tomography will allow the user to obtain a complete picture of the sample in a non-destructive fashion. This webinar goes into detail regarding sample preparation for topography and array tomography.
Price
Free
Language
English
Who can attend
Everyone
Dial-in available? (listen only)
Not available.

Hosted By Leica Microsystems

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