Scanning Electron Microscope (SEM) is used to examine surface morphology in biological and material applications that demand the preservation of a specimen's surface details. Chemical processing is important to stabilize the structures, followed by critical point drying for drying samples for SEM applications.

To allow for sample imaging, non-conductive samples must be coated after drying. Adding a conductive coating of metal or carbon to the sample prevents charging, lowers heat damage, and improves the secondary electron signal needed for topography study.
In addition to surface analysis, a comprehensive study of the sample using array tomography will allow the user to obtain a complete picture of the sample in a non-destructive fashion. This webinar goes into detail regarding sample preparation for topography and array tomography.