Emspira 3 combines everything needed to perform comprehensive visual inspection into a single system, including comparison, measurement, and document sharing. Save time when meeting demanding throughput targets and inspecting diverse samples with Emspira 3. The robust design of Emspira 3 allows you to focus confidently and reliably on your inspection work both in production and laboratory environments.

Join our masterclass to see a live demo on how the Emspira 3 empowers users to streamline inspection processes, cover inspection needs flexibly, and work in a confident and reliable way, with a single system.

Learning Objectives
• Directly compare to references with a single click
• Measure directly during visual inspection without a PC
• Annotate images without a PC
Veronique Teo
Senior Applications Specialist, Leica Microsystems (SEA) Pte Ltd
Veronique is a Senior Application Specialist for Leica Microsystems, SEA, and Taiwan with many years of imaging experience, taking care of local and regional sales support and distributors support and training.

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