Sponsored by Menlo Micro and RFMW, this webinar will explore the process of single insertion testing for asymmetric TX/RX SerDes interfaces, utilizing the Menlo Micro Dual DP3T relay with integrated high-density loopback relays. This solution is ideal for high-speed applications such as PCIe Gen5/6, CXL, USB/Thunderbolt, and Ethernet, offering precise control and reliable performance in demanding environments.


The session will provide a detailed overview of testing complex SerDes interfaces, focusing on the challenges and methodologies for controlling both TX and RX differential pairs, including asymmetric signal flows. Key topics will include optimizing high-speed testing for frequencies up to 20 GHz, simplifying test setups, and reducing testing complexity. Attendees will gain practical insights into fixture design, PCB design parameters, and techniques to minimize impedance discontinuities. The webinar will also cover the differential signaling scheme, eye diagram test setup and conditions, and a comparison of measured eye-diagram performance versus simulation results. Additionally, we will demonstrate how the combination of PCIe 6.0 loopback and differential DP3T MEMS switches ensures optimal eye height and width, without the need for pre-emphasis or equalization.