Aberration correction in scanning/transmission electron microscopy (S/TEM) has enabled directly-interpretable imaging of light elements such as O and Li at the atomic scale. Observing such elements combined with their native and resulting states before and after cycling/degradation becomes critical to material performance. Correlating STEM imaging with X-ray and energy loss spectroscopies, and electronic structure characterization thus provides a unique position-sensitive view of the material down to the atomic scale.

This webinar will focus on recent developments in STEM-based characterization techniques of relevant battery and other energy materials. Particular attention will be paid to novel detectors and detection methods, real-time dose control, and chemical spectroscopy, all which enhance the efficiency and applicability of STEM characterization to energy materials.