About
Assess stability of optoelectronic parameters is nowadays requested by many customers.

Typical pass/fail criteria are not useful while no actual information about optoelectronic parts (mostly COTS) are operated in space environment or sometimes in ways for which were not designed. Detailed study of the degradation or failure modes may determine that not fully compliant devices may still be suitable for a certain application.

This need is addressed and explained with several real examples tackled by the Optoelectronics laboratory every day.
Presenter
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Juan Moreno Echarri
Optoelectronics and Innovation department at ALTER
Juan Moreno has a bachelor’s degree in physics and since 2010 has worked in the Optoelectronics and Innovation department of ALTER. In charge of the BepiColombo/SolO SiC blocking diodes as a test engineer for years. Currently responsible for radiation tolerance improving SiC modules and SiC plastic modules testing. Nowadays, he is the technical contact point for the SiC diodes development in ALTER.