A fully metrological measurement made by a VNA is comprised of a value, a unit, an uncertainty, and the confidence interval of the uncertainty. Measurement uncertainty, or accuracy, is stated on the VNA datasheet. Still, a complete understanding of the error components which contribute to overall uncertainty is helpful to inform and enable the user of the equipment to make the best possible measurements.
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Brian Walker is the Senior RF Engineer SME at Copper Mountain Technologies where he helps customers to resolve technical issues and works to develop new solutions for applications of VNAs in test and measurement. Previously, he was the Manager of...