Dr. Schultz is the Chief Scientist at the Compass Technology Group where he leads research and development efforts in RF materials and measurement technology. Previously he was a Technical Fellow at the Georgia Tech Research Institute, where he led programs in experimental and computational research on the electromagnetic properties of materials, structures, and antennas. He has developed materials characterization methodologies via free-space, waveguide, resonant cavity, and impedance analysis instrumentation. He has also modeled electromagnetic composite materials and developed new composite material concepts for novel antenna applications. He has used thermal analysis, microscopy, and analytical techniques to correlate microstructure to macroscopic properties in his research for providing new insight into electromagnetic material characteristics. Dr. Schultz has also developed new techniques for microwave measurement of scatter phenomena and has applied these techniques to materials ranging from composites to camouflage nets. Dr. Schultz’s backscatter methodologies have become an accepted standard method for characterizing diffuse microwave scatter in numerous government and industrial laboratories. In previous positions, he has worked in the areas of novel polymer processing including stereolithography, polymer film formation, and conductive polymers.

- MA, 1990, (Physics); Ph.D. University of Dayton, 1997, (Materials Engineering)
- Former Tech Fellow at Georgia Tech Research Institute
- ‘Wrote the book’ on Focused Beam Methods
- Expertise: Electromagnetic materials design and characterization