Effects of Random Factors on the Metrology of VNA Measurement
WEBINAR ENDED
Wednesday, December 7, 2022 · 2:00 p.m.
· 1 hour
Effects of Random Factors on the Metrology of VNA Measurement
Wednesday, December 7, 2022 · 2:00 p.m. · Indiana (East)
About This Webinar
This webinar will examine the sources of measurement error and the residual errors still present after calibration. The two types of errors, random and systemic will be introduced along with methods to mitigate or control them.
Brian Walker is the Senior RF Engineer SME at Copper Mountain Technologies where he helps customers to resolve technical issues and works to develop new solutions for applications of VNAs in test and measurement. Previously, he was the Manager of RF design at Bird Electronics, where he managed a team of RF Designers and designed new and innovative products. Prior to that he worked for Motorola Component Products Group and was responsible for the design of ceramic comb-line filters for communications devices. Brian graduated from the University of New Mexico, has 40 years of RF Design experience, and has authored 3 U.S. Patents.