A New Method for Dielectric Property Measurements
Dielectric properties are important for design of antenna and wireless technologies. As the internet of things, 5G, automotive sensing, and other advanced technologies become more prevalent, product designers and manufacturers require accurate material properties for ensuring their devices operate as desired. This webinar will provide information about dielectric materials measurements and introduces a new dielectric measurement method, called the “epsilometer”. This method was developed to make dielectric property measurement accessible to the device designer. Not only was it designed with advanced computational electromagnetic design tools, but it was specifically engineered to make dielectric measurements both affordable and easy to do. This webinar will overview the new epsilometer method and give examples of how it can measure a variety of dielectric materials used to manufacture of wireless devices (e.g. substrates, radomes, etc.).
- Overview of dielectric materials measurement methods
- Introduction to technologies that enable improved material measurements
- Overview of the epsilometer, a new and more affordable way to obtain material dielectric properties
